(in Polish) Microscopic Methods in Forensic Sciences 310-ERS-BSVI-2

study profile – general
form of study – stationary
type of course – obligatory
Field: exact and natural sciences, discipline: chemical sciences
year -3.
Entrance requirements - non
Number of hours - 30 , lecture -15, labor - 15
Teaching methods – conversational lecture, lecture with elements activating students, moderated discussion, student presentations, case study,

ECTS points – 3
Student workload balance:
hours ECT3
Overall student workload 75,0 3,0
classes 15,0 0,6
other activity 15,0 0,6
Preparing for classes 41,3 1,7
examination 3,8 0,2

Prerequisites (description)

The aim of the classes is to become familiar with selected microscopic methods in the context of examining evidence materials of various origins. The student learns advanced microscopic techniques for identifying evidence materials. Becomes familiar with the technical aspects of individual microscopy techniques. The student acquires knowledge of how to use modern devices. Becomes familiar with various measurement techniques used in working with specific evidence materials and methods of sample preparation.

Course coordinators

Beata Kalska-Szostko

Type of course

obligatory courses

Mode

(in Polish) w sali

Learning outcomes

KP6_WG12 - explayn the basics of operating scientific and research equipment with particular emphasis of microscopic methods

KP6_UW5 written descibed scientific research related to forensic problems in the context of microscopic methods

KP6_KO1 - is interested in chemical processes that occur in the environment in the context of forensic analyses

Assessment criteria

Written exam in the form of project with presentation and discussion

Bibliography

1. „Magnetic microscopy of nanostructures” H. Hopster, H.P. Oepen Springer 2005
2. "Introduction to electron microscopy" Andres Kaech 2013
3. "Transmission Electron Microscopy: A Textbook for Materials Science", D.B. Williams and C.B. Carter, 2009
4. "INTRODUCTION INTO TRANSMISSION AND SCANNING TRANSMISSION
ELECTRON MICROSCOPY", FRANK KRUMEICH, 2nd version, March 2022
5. "Fundamentals of Scanning Probe Microscopy", V. L. Mironov 2004
6. "A PRACTICAL GUIDE TO SCANNING PROBE MICROSCOPY" Rebecca Howland and Lisa Benatar, 2000

Term 2024:

Term 2025:

Term 2026:

Additional information

Additional information (registration calendar, class conductors, localization and schedules of classes), might be available in the USOSweb system:

Description of 310-ERS-BSVI-2 in USOSweb