Monographic Lecture 390-FS2-2PMD

Topics covered in lectures:
1. Electromagnetic radiation as a research tool
2. Methods of accelerating charged particles
3. Basics of synchrotron beam physics
4. Free electron laser
5. Basic synchrotron techniques used in condensed matter analysis
6. Basics of X-ray Absorption Spectroscopy (XAS)
7. Near-edge absorption structure (XANES)
8. Extended fine structure of the absorption spectrum (EXAFS)
9. The importance of temperature in the analysis of absorption data
10. Methods of XAS data analysis
11. Basics of X-ray Emission Spectroscopy (XES)
12. Rowland circle geometry
13. The role of the analyzer in XES measurements
14. Methods of processing raw XES data
15. Application of XES measurements in condensed matter analysis

Topics covered in lectures:
1. Definition of the surfaces. Miller indices. Matrix notation. Wood notation. Surface reconstruction.
2. Vacuum technique. Clean surface preparation.
3. Layer growth/deposition techniques: MBE, ion scattering, PLD.
4. Electron-surface interaction. Scattering. Plasmons. Auger electrons. AES. Electron diffraction. Ewald construction. LEED, RHEED.
5. Design of electron guns and spectrometers.
6. Chemical composition. XPS.
7. Surface morphology. SEM.
8. Crystal structure. TEM.
9. Scanning electron microscopy. STM, AFM, MFM, SNOM, NV-center magnetometry.

Literature:
1. Scott Calvin – “XAFS for everyone”, CRC Press, 2013.
2. Grant Bunker – “Introduction to XAFS”, Cambridge University Press, 2010.
Supplementary literature:
1. Giorgio Margaritondo – “Elements of synchrotron light: for biology, chemistry, and medical research”, Oxford University Press, 2002.
2. References given during the lecture.
3. Internet resources.

Literature:
1. H.Lueth, Solid Surfaces, Interfaces and Thin Films, 6ed, 2015
2. H. Ibach, Physics of Surfaces and Interfaces, 2006
3. D.L Allara, R.L. Opila, Surface and Interface Science, 2025
4. References given during the lecture.
5. Internet resources.

During classes, it is permitted to use AI systems in the following areas:
1. Machine translation of source texts from foreign languages.
2. Searching for and organizing scientific sources.
3. Creating simulations and modeling of physical phenomena discussed during the lecture.

Use of AI systems is not allowed during the exam.

During classes, it is permitted to use AI systems in the following areas:
1. Machine translation of source texts from foreign languages.
2. Searching for and organizing scientific sources.
3. Creating simulations and modeling of physical phenomena discussed during the lecture.

Use of AI systems is not allowed during the exam.